Abstract: Copper nanowires were first synthesized through a liquid phase reduction method, and then the PVDF/copper nanowire thin films were prepared by using spray coating and wire rod coating technologies. The crystalline structure of copper nanowires was determined by X-ray diffraction measurements, and their morphology was characterized by scanning and transmission electron microscopy. The light transmittance and surface electrical resistance of the thin film was obtained by a UV spectrometer and a four-point probe method, respectively. The results indicated that the prepared copper nanowires had a diameter of approximately about 60 nm, a length of 60~80 μm and a high aspect ratio, and they exhibited a high purity and a good dispersion with the help of synergistic effect from inducing agent and stabilizing agent. The thin film achieved a maximum light transmittance of 61 % and manimum surface resistance of 40.7 Ω at the copper nanowire concentration of 0.08 mg/mL.

Key words: copper nanowire, liquid phase reduction method, transparent conductive film, polyvinylidene fluoride