China Plastics ›› 2011, Vol. 25 ›› Issue (05): 17-23 .DOI: 10.19491/j.issn.1001-9278.2011.05.004
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SUN Hui
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Abstract: Some features and applications of poly (ether ether ketone) were briefly introduced. Several recent surface modification methods for PEEK films were reviewed, including plasma treatment, ultraviolet irradiation, and wet chemistry. In addition, several major surface characterization methods such as scanning electron microscope (SEM), X-ray photoelectron spectroscopy (XPS) and atomic force microscope (AFM) were described.
Key words: surface modification, poly (ether ether ketone), surface characterization
CLC Number:
O631
SUN Hui . Surface Modification and Characterization of PEEK[J]. China Plastics, 2011, 25(05): 17-23 .
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URL: https://www.plaschina.com.cn/EN/10.19491/j.issn.1001-9278.2011.05.004
https://www.plaschina.com.cn/EN/Y2011/V25/I05/17